Research On Automatic Vector Validation Method Based On Baseband Chip

Nowadays,the rapid development of mobile communication device has gradually become an integral part of people's daily life with the popularity of the internet.As the core of mobile communication device,the test work of the baseband chip affects the quality and development cost of mobile communication device directly.The process dimension of baseband chips is getting smaller and smaller,and the integration and complexity are getting higher and higher with the rapid development of the integrated circuit industry.The generation of test vectors with high quality and large quantity for testing is to ensure the good performance of the baseband chip,but it will introduce more test contents and increase the difficulty of test vector conversion.Test vectors need to be validated on ATE.A large number of test vector validations will lead to the shortage of ATE test resources and a large amount of test workload,because ATE is complex,expensive to use and has a high technical threshold.In summary,how to achieve high efficiency,stability and low cost for the baseband chip testing is worth studying.Firstly,this article introduces the current status of ATE research at home and abroad,and the significance of ATE testing for the baseband chip.Secondly,it states that the V93000 test system includes hardware and software,and introduces the basic theory of chip testing from ATE and DFT.Thirdly,in-depth analysis and research on the current universal test vector validation process.Finally,an automated test vector validation process for the baseband chip is proposed and implemented.The main research in this paper is as follows:Firstly,according to the large amount of test vector data of the baseband chip,studying the difficulties and challenges in the current common test vector verification process,and proposing targeted solutions.The solution is to automate the test vector validation process.The key technologies are the automatic test vector conversion and compression and the automatic test flow generation.Secondly,design and implementation of the automatic test vector conversion and compression tool.First of all,in-depth study of the commonly used baseband chip test vectors in STIL format and the test vector definition method of the V93000 test system and finding the correlation between two methods.Next,using the V93000 test system as the test platform,four test vector compression methods are proposed: X-Mode,Multiport,Memory Pooling,and Memory Sharing.In the end,design the automatic test vector conversion and compression tool and implemented based on Perl script.Thirdly,generating the Test Flow tool automatically.First of all,the function,structure and representation of the Test Flow in the V93000 test system are described.Next,identifying the components of the Test Flow file and their sources.In the end,designed to generate the Test Flow tool automatically and implemented based on Perl scripts.At the end of this article,the experiment are designed to validated the feasibility of the automatic test vector validation process and its key technologies.It can greatly shorten the period of the test vector validation process,speed up the development of test programs,improving the conversion efficiency and the success rate of test vectors,providing customers with efficient test development services,reducing test costs and TTM.