Research On Generating Method Of Test Stimulate For A Waveform Generator

Waveform generator is an important part of measurement and control equipment.Test excitation generation is the first step in fault detection when maintaining waveform generator.According to statistics,waveform generator faults are often concentrated in the signal conditioning part and digital-to-analog conversion part.Therefore,this paper focuses on the test excitation generation of analog and digital-analog hybrid circuits.In the analog circuit,the fault detection rate is low because the potential fault features are weak.For this problem,this paper proposes a synthetic analog circuit based on deviation test excitation generated method,and uses the greedy algorithm incentives set for further optimization of the test,the method for the optimal frequency of the circuit.The superposition of sine wave as the simulation of the optimal frequency circuit test incentive,will maximize stimulate the analog circuit fault feature,so as to achieve the aim of improve the analog circuit fault detection rate.Then apply the algorithm is given in Sallen-Key band-pass filter circuit,Leapgrop filter circuit and the actual process of signal conditioning circuit of waveform generator,and the algorithm is given in the three circuit to obtain the optimal frequency set,and under the optimum test excitation circuit fault detection rate,finally the method are compared with the traditional pulse,and through the SVDD classifier to detect fault,respectively to obtain the fault detection rate under two kinds of incentive,this paper demonstrates that the proposed method is effective.In order to solve the problem of high cost and long time in the traditional digital-analog hybrid circuit fault detection,this paper proposes a method of optimizing excitation based on the GAD-Tent chaos model.On the basis of the D-Tent chaos model,genetic algorithm(GA)is used to optimize the parameters of the model.The chaotic sequence obtained by GA is both random and deterministic.It is effective for fault detection.In this paper,the test sequence as a mixed-signal circuit testing incentive to test the circuit,and applying this algorithm is given to the 8-bit D/A conversion circuit and waveform generator of D/A conversion module in the actual process,the method and sequence and random sequences into hybrid circuits of the fault detection rate for comparison,proved that the method in fault detection rate at the same time,reduce the testing time,reduce the size of the test.