Research On Radio Frequency Performance Test Scheme Of LTE SOC Based On ATE

Wireless communication technology has become an indispensable part of daily life with the advent of the information age.As the core part of wireless communication products,the test of RF chips directly affects the quality and production cost of terminal products.The automatic test equipment is generally used for chips production.However,the automatic test equipment is faced with new challenges due to the continuous innovation of communication technology.At the same time,ADC's sampling frequency-often can't meet the test requirements of RF signal that has a large bandwidth due to the complexity of the system,the high technical threshold and the huge expense of the update cost system.So mass production testing of the chips was halted.Therefore,it has a great significance to study how to use an ADC that has a low-sampling frequency to solve the production test requirements of RF chips.The purpose of this paper is to design a test solution that can use a low sampling frequency ADC to test the chips that a large bandwidth.Firstly,the paper introduces the development status of ATE at home and abroad and the challenges faced by the automatic test equipment.The paper establishes the research direction and content of this topic.Secondly,the paper introduced the structure of the V93000 system architecture and the basic principle of signal sampling.Thirdly,the paper study the test board design,transmission function test and reception performance test of the LTE chips.Finally,the paper uses a better test board card to finish the same project.The research content of the paper is as follows.First of all,the design scheme of the test board is determined based the research and analysis of the test chip,including the power supply part,the clock part,the digital pin part for the communication protocol,the analog part and the RF part.The next specific research direction of the paper was determined by studying the technical difficulties in RF performance test of the LTE chips.Secondly,the processing method of intermediate frequency signal is studied based on software radio.Firstly,the paper designs a new equivalent sampling method by analyzing the V93000's clock system and study the sampling method how to work in RF performance test,which solves the problem that the error vector amplitude test cannot be carried out because the sampling frequency is too low.Then,the paper converted a intermediate frequency signal to zero frequency digital signal based on digital down converter.Finally,the design and implementation of FIR digital filter is studied based on C++.Finally,the performance parameters to be tested were determined according to the test requirements of the LTE chips.the test schemes were designed for different performance parameters.The ADC that have a low sampling frequency of was used to realize the mass production test of the chips.Finally,the better test board is used to carry out the same test project for and the test results of the two ways are compared and analyzed to verify the reliability of the test scheme.