Research On Reliability Design Method Of 12 Bit A/D Converter Circuit

With the rapid development of modern electronic technology,IC came into being high precision high speed and low power consumption,integration degree is higher and higher,the device feature size is getting smaller and smaller,two dimensional effect of the device is continuously enhanced,this leads to growing device of the internal electric field and current density,and greatly increase sensitivity to defects;meanwhile,new applications require IC to expand its work in the field of high voltage,high temperature,high frequency and high power,all of these make the reliability problems of IC increasingly severe.This article selects 12 bit A/D converter circuit as the research object,carries out research the reliability design technology to adapt to the characteristIC of A/D IC,and forms a set of perfect and effective design resources,through the comprehensive and quantitative analysis and design,it can ensure the reliable application of IC,and meet the requirements of the development unit of the whole machine for the high reliability IC,by comprehensively and quantitatively analysising and designing,to ensure the reliable application of IC and meet the requirements of the development unit of the high reliability IC.The main contents of this paper are as follows: 1.Tolerance designAs for the IC,there are differences between actual chip production process and the ideal situation,thus,in the process of IC design,we need to address differences,select the optimal design parameters and the best and most reliable range of work by using computer-aided design,ensure that the design of the device can meet the actual job requirements.2.Radiation hardened designWith the rapid development of space technology,satellite and manned spacecraft,deep space exploration project of sustainable development,more and more devices should be used in the cosmic radiation environment,due to radiation,the parameters of IC in the degradation or even failure,thus machine does not work.Therefore,it is necessary to carry out the radiation hardened design of IC to ensure that the circuit designed can meet the corresponding space radiation environment.3.Strengthen the compatibility design of ESD protection and irradiationWith the development of the IC technology,integrated circuit of the transistor feature sizes shrinking,antistatic ability of the device is more and more weak.A lot of antistatic ability inferior products,in the process of manufacture,transportation and use of product failure caused by the electrostatic more and more,it is not only increase the cost,but also reduce the product reliability.Especially for IC,because of the special application environment of the circuit,often need to have certain anti radiation ability,but the ability of anti radiation devices usually with antistatic ability is contradictory,therefore,must be combined with the simulation process and the characterist IC of line integrated circuit,to carry out suitable for the simulation of antistatic design,to ensure that the device design produced to meet the required anti-static grade.4.Thermal design and anti-latchup designExcept above the major reliability issues,the IC is also facing with the failure mechanism of digital-mode noise interference,latch-up effect,electromigration effect,antenna effect,thermal runaway failure,so it is necessary to analyze the key factors of the impact mechanism respectively according to the above-mentioned failure mechanism,and put forward the corresponding design reinforcement method.5.Research on reliability design method of 12 bit A/D converter circuitIn this paper,a 12 bit A/D converter is selected to carry out reliability design such as analog integrated circuit ESD protection,radiation protection,ESD protection and radiation reinforcement compatibility,and through reliability verification test,the reliability of the designed circuit is verified.