Temperature Effect On Conducted Electromagnetic Susceptibility Of Digital Signal Controller

Nowadays,electronic information equipment has been widely popularized in various key areas such as aerospace and military equipment.Its effect on complex electromagnetic environment has become more and more serious.As the core unit of electronic information devices,DSCs(Digital Signal Controllers)directly determine the efficiency and electromagnetic function security of the system by electromagnetic compatibility.Under the influence of electromagnetic and temperature combined stress,the drift of DSC susceptibility level will cause software errors and hardware fault,leading to the performance degradation and function failure of the whole system.Therefore,the study of temperature effect on DSC conducted electromagnetic susceptibility is significant to improve the electromagnetic compatibility and reliability of electronic information equipment.In this paper,the research of the temperature effect on DSC conducted electromagnetic susceptibility is developed by theoretical analysis,modeling simulation and experiments.The coupling and action mechanisms of electromagnetic interference signal are investigated by analyzing the structure and functional characteristics of DSC.Taking temperature effect into account,an equivalent model of DSC conducted electromagnetic susceptibility is built.And based on it,susceptibility thresholds and their temperature drifts are measured and analyzed.Moreover,an experimental platform is designed to analyze the temperature effect.The influence of electromagnetic and temperature combined stress on the key parameters of DSC is measured.Finally,the theoretical analysis and simulation results of temperature effect on DSC conducted electromagnetic susceptibility are verified by experiments.Main works of this paper are included as follows.1.The functional mechanism of electromagnetic interference and its temperature effect on DSC are analyzed.Besides,we point out the threat from electromagnetic and temperature stress to DSC electromagnetic function security.With regard to functional and electrical characteristics of a typical chip TMS320F2812,the structure and electromagnetic features of GPIO and ADC are explored.Furthermore,the electromagnetic stress features are analyzed from three aspects,electromagnetic interference coupling mode,action mechanism and failure mechanism.Then the characteristics of DSC electromagnetic susceptibility are obtained.Combined with the semiconductor reliability theory,the temperature effect on electromagnetic characteristics of MOS transistors in DSC is derived.2.A method to establish the model on DSC electromagnetic susceptibility temperature effect is presented.In addition,the temperature effect on DSC electromagnetic susceptibility is simulated and elaborated.By studying the structure of DSC susceptibility behavior model,the temperature effect on structural parameters of each part in the model can be excavated.An equivalent model for the passive distribution network and immunity behavior unit is constructed,in the meantime,the temperature factor in this model is represented.We simulate the changing of electromagnetic susceptibility with different temperatures and do a comparison with the test data.Compared with these results,our model can efficiently predict the temperature effect on DSC electromagnetic susceptibility during the frequency range from 10 MHz~1 GHz,within the error range of less than ±4 dB for typical temperature.3.The platform to test IC electromagnetic susceptibility temperature effect is constructed,and the ambient temperature effect is quantitatively analyzed when considering the electromagnetic susceptibility of DSC functional modules.Based on direct power injection and temperature variable control methods,hardware and software experimental platforms of DSC is achieved.Given the typical digital and analog modules of DSC,i.e.,GPIO and ADC,the influence of electromagnetic and temperature combined stress on the interference coupling path impedance parameters and DSC operating parameters is measured.Further,we obtain the susceptibility threshold of each function module under different temperatures.Results show that the mobility and threshold voltage of MOS transistors in DSC is changed with ambient temperatures,which leads to the drifts of DSC electromagnetic susceptibility.