Study On Susceptibility Of Microcontroller Under Electrical Fast Transient Interference

With the improvement of semiconductor device manufacturing process and interconnect technology,microcontroller with nanoscale technology has become the absolute mainstream in the chip market.However,higher integration and lower operating voltage make microcontroller faced increasingly electromagnetic compatibility(EMC)problem.Among the interference sources,electrical fast transients(EFT)interfere has become an important factor to the normal work of microcontroller.In addition,the electromagnetic reliability(EMR)of microcontroller is closely related with the variation of its EMC susceptibility during the life cycle.Based on an integrated circuit(IC)level power-on EFT test platform,standard EFT generator and IC level EFT generator are using as the interference source respectively to analyze the failure mechanism of microcontroller caused by EFT interference and study the impact of different EFT interference on the EMC sensitivity of microcontroller in this paper.Then,combining aging with the EFT test,the IC level EFT generator is selected as the interference source to study the change of microcontroller's EMC susceptibility during the aging process,and explore the causes and mechanism which caused the variation of microcontroller's EFT susceptibility.In the first part,the test method of EFT susceptibility is introduced.First,the characteristics of EFT pulse signal are analyzed,including its formation mechanism,the pulse waveform and energy.Then introducing the system level and IC level test methods of EFT susceptibility respectively,and analyzing their advantages and disadvantages when used to test the EMC susceptibility of IC.After comprehensive consideration,finally the IC level EFT pulses asynchronous injection method is selected to research the EMC susceptibility of microcontroller.In the second part,the EMC susceptibility of microcontroller under different EFT interference is studied.First,according the microcontroller selected and IC level EFT susceptibility test method to set up test platform,design test board and debug test code.Then,the possible failure types and mechanism of microcontroller under EFT interference are explored systematically.Finally,pass analyzing the test result of EFT injection into microcontroller to study the effect of different EFT interference on the susceptibility of microcontroller,and the failure types of microcontroller under EFT interference are confirmed by the test result.The third section explores the variation of microcontroller EFT susceptibility during aging and analyzes the reasons which cause the variation of susceptibility.First,aging conditions are set up,and aging and EFT test scheme is formulated.Then,the loss mechanism of device which may result in performance degradation of microcontroller is analyzed and studied.Finally,the EFT susceptibility of microcontroller under two different temperature stresses is tested respectively.And according to the test results,it is found that accelerated aging mainly influences the EMR of power supply network,resulting in the decrease of microcontroller's EFT susceptibility performance.