Improvement Of Testing Algorism For Optical-Electric Transceiver

Data communication systems via internet are increasing quite quickly, along with super computer & data centers building. Related high speed interconnection product market is also growing amazingly. Especially about QSFP+ transceiver, which was widely used starting from 2012, whose market is more than 1 billion USD per year.Due to the differences between each VCSEL used by QSFP+, we have to tune and test each QSFP+ module to ensure good performance and quality. So lots of Capex budget to build tester and hire operators are needed. Costs of testing become very important among the whole cost model.To reduce the testing cost and improve test efficiency, we need to analyze current test method and improve it.Design and build up a full automatic optical transceiver test system. Come up the new test algorithm for parallel testing with single thread. This new algorithm could be also easily implemented to other multi-channels optical transceiver communication system testing.After improve the test method, with same test repeatability confidence level, The complexity of the algorithm is reduced significantly, from O(log(n))(actual 40 times) for binary search to O(1)(actual 12 times) for fitting. Reduce the average test time from 677 sec to 148 sec, saved 8.8mis, reduce manufacture cost for each product 1.9 USD, the economic benefits in a year is over 1 million USD.