Font Size: a A A

Automatic Test System For Performance Characteristics Of The Half-Bridge Driver Chip

Posted on:2017-06-10Degree:MasterType:Thesis
Country:ChinaCandidate:Y H ZhuFull Text:PDF
GTID:2348330491962690Subject:Integrated circuit engineering
Abstract/Summary:
The half-bridge driver chip has the advantages of smaller volume, higher reliability and simple peripheral circuits, so it is widely used in motor driver, SMPS, electronic bus and so on. Performance characteristics of half-bridge driver chips will be changed because of different condictions. So, performance characteristics must be tested correctly before the system is designed.The automatic test system for half-bridge driver chip referred in the article can solve the problem of low accuracy and efficiency in manual test.Half-bridge driver cihp core parameters include static parameters, switching times and dv/dt. Firstly, according to the static testing scheme of half-bridge driver chip, it is founded that many parameters and instrument separation is the biggest testing difficulty and the system complete automation control hardware based on Lab VIEW for high efficiency. Then, the thesis deeply analyze the switching time test circuits, and the results show that the dynamic parameters of parasitic parameters will adversely affect the accuracy of the test, which can cause shock wave even damage to the device, so the thesis creates a new switching time testing circuit which takes the consideration of parasitic parameters for guiding switching time test system design, and analyze the influence of various parasitic parameters on the testing precision, which are verified by Saber simulation. Then, the thesis of the traditional dv/dt test circuit is improved, the effection of driving resistance is derivated and a dv/dt test optimization circuit named "source Kelvin connection" is gived. Finally, the thesis establish a high-precision dynamic parameters and automated test systems by programming hardware and software to automate the control and data processing and analysis hardware.The error of static parameter is 5%, time consuming is less than 20 minutes, the intelligen test system improves the efficiency of 50%, dynamic parameter error is within 5%, time-consuming is 2 minutes, the intelligen test system improves efficiency of 60%, dv dt test module can provide signal high dv dt of 80V/ns, the performance of all meet the design specifications.
Keywords/Search Tags:Half-bridge driver chip, High accuracy, Automatic test system, Parasitic parameter
Related items