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The Design Of Single Event Upset Fault Test System Oriented To Airborne Storage Unit

Posted on:2016-01-21Degree:MasterType:Thesis
Country:ChinaCandidate:Z LiFull Text:PDF
GTID:2322330503488290Subject:Safety Technology and Engineering
Abstract/Summary:PDF Full Text Request
Airborne storage unit is an important part of the avionics data communication system, failure of the key storage data will have a significant impact on flight safety.In recent years, along with the development of chip manufacturing process, the electronic components' size are getting smaller and smaller, if this kind of device installed in the avionics system, it would greatly improve the probability of single event upset, therefore, SEU fault detection becomes more and more important. In this paper, the airborne storage unit's single event upset failure is studied, according to the different features of parallel port communication, serial port communication and ARINC429 bus communication, three different fault test systems are designed respectively.In the aspect of hardware, set the FPGA minimum system board as main control part, it finishes tasks of data transmission, simulated faults produced and the mutual transformation between different signals, etc, NI 6548 digital transceiver and AIM company's ACX429 interface card are used to complete data acquisition task; In the aspect of software, LabVIEW and MATLAB mixed programming method is used to generate test data, single event upset fault test systems are developed based on LabVIEW software and PXI automatic test platform.Traditional test system usually designed only by hardware tools such as oscilloscope and logic analyzer etc, its wiring is complex and data analysis process inefficient. The test system in this paper combine software and hardware tools,LabVIEW software controls hardware tools to perform the testing work, both reduce the wiring and could simulate airborne storage unit's SEU fault and its effect on test system, real-time monitor failure state, accurately locate the fault addresses. To sum up, this test system could reduce the workload, greatly improve test efficiency.
Keywords/Search Tags:SRAM, ARINC429, LabVIEW, FPGA
PDF Full Text Request
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