Implementation And Signal Integrity Optimization In Nanometer ASIC Physical Design

Signal integrity is the ability of an electrical signal to carry information reliably and to resist the effects of high-frequency electromagnetic interference from nearby signals. When the information carried by electronic signal distorted, or the electronic signal influenced by high frequency electromagnetic interference, signal integrity problem emerged.At present, the integrated circuit technology has been developed to nanometer level, the clock frequency is up to GHz. With the development of semiconductor technology, the interconnection problem of integrated circuit has become the leading factor of the chip performance, power consumption, reliability and cost. Signal integrity problem has become the major bottleneck that restricting the development of VLSI.The signal integrity problem in ASIC physical design can be divided into two types: crosstalk noise and electromigration. Crosstalk noise is caused by coupling capacitance between the wires, which affects circuit delay, cause timing violations(crosstalk delta delay) and compromise the circuit function(crosstalk glitch), thus resulting in chip failure. Electromigration caused by chip parasitic resistance will cause a reduction in chip performance, and even lead to chip failures.In this paper the signal integrity problem under nanometer technology is analyzed based on ASIC physical design, preventive measures and restoration method has been proposed. First of all, interconnect delay and parasitic parameter extraction is modeled and analyzed, exploring the method for reducing crosstalk noise and combining with physical design tools IC Complier, expounded mainly on prevention and repair of convergence to crosstalk noise optimization method. Finally, this method is applied to the BELAB project, the verification results show that the prevention strategies can significantly reduce the signal integrity problem, restoration method can effectively reduce the number of iterations to quickly solve the signal integrity problem. The paper introduce the method for electromigration analysis based on physical design tools IC Compiler, and find a breakthrough from the various parameters to optimize electromigration. This method is verified by laboratory projects to has a good optimization effect on electromigration.The practical significance of this paper is put forward the optimization method of the signal integrity problem of nano technology, improving the physical design flow of nano technique, and through BELAB actual project of module SHA- 256 physical design verifying the feasibility of this method.