The Design Of Microwave Automatic Testing System Based On C# Language And Database

Because of the huge technological advantage of electrical scanning, the phase array radars bring the radar technology a revolutionary leap, whose core subsystem are T/R modules mainly made by monolithic microwave integrated circuit (MMIC) chips composing the antenna surface array. So they have been the pivotal technology, which all the powerful countries are competing with their rivals. With decades of continuous improvement and development, the microwave components have been much smaller and more integrated multifunctional and advanced nowadays. It is the problem that the advanced performance and diversity of the devices, the complexity of the measurement and its tremendous data puts forward a huge challenge to the measurement. The demands for a high efficiency testing system are more and more strict and harsh; the traditional manual test is no longer useful. Hence the development of the automatic testing systems combining the technology of virtual instrument automatic control and large data processing ability are much desiderated. Thus this article designs an automatic microwave testing system for the measurement of different kinds of devices, which combines the high efficiency and flexibility of C# language with the high precision and speed of the modern instruments. With the help of this system, users can measure the devices quickly, store and handle the data safely, meanwhile analyze the results easily. This system also takes advantage of the strong data storage and processing abilities of the relational database and a humanized graphical user webpage interface; therefore it could make the measurement much more convenient.