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Ethernet Multiple Test Data Acquisition And Control System Design

Posted on:2016-11-17Degree:MasterType:Thesis
Country:ChinaCandidate:C X CaiFull Text:PDF
GTID:2308330470466173Subject:Electronics and Communications Engineering
Abstract/Summary:PDF Full Text Request
The main content of this paper is to design and implement a multi- test instrument data acquisition and control system for various types of instruments need to be, research direction is to realize distributed multi-test instrument for data acquisition and controlling based on industrial Ethernet. The system is divided into two parts, one part is host computer another one is lower computer. Host computer is based on high performance server and lower computer is composed by embedded system STM32 microcontroller and test instruments. As datum accquisiton terminal, STM32 microcontroller connect multi-test instruments by RS485 bus, and connect host computer through transplanting Lw IP e mbedded network protocol stack for network communication. In responce to the features of great amounts of instrument connections, frequently datum communication, high demands of real-time datum acquisition, host computer software take the network model of IOCP as a core and combined with windows multi-threads, database programming technology to achieve high performance communication services.The whole system will centrally display, analyze and set up all real-time datum uploaded by lower computer with characteristics of high stability, low cost, high speed as well as high practerical value.The innovation of this system is that: this system is not only can be use d for current diode TRR tester, but also can be applied to different types of instruments by abstracted equipment information into a unified information resource table. Firstly data accquistion terminal based on embedded system connect test instrument and receive test information resource table. Then embedded system send table to host computer through industrial Ethernet. Host computer builds a virtual test instrument moudel, and use this moudel to ask embedded system terminal send test datum and control working model of instrument.The system has been tested many times, it meet the requirements of accurate datum transformation, verifing the feasibility and practicality of the design.
Keywords/Search Tags:test instruments, Ethernet, microcontroller, data acquisition
PDF Full Text Request
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