A Design And Research Of An Experiment Testing Device On DSP Chips

Within the high computation speed, strong processing performance and other characteristics, Digital signal processors(Digital Signal Processor, DSP) is having a widely range of applications in all areas of electronic products. The testing for DSP chips is able to contain its electronic system applications designed to provide the accuracy and reliability of the support. Therefore, the DSP functionality and performance testing is of great significance in the design of electronic systems included in the DSP chips.This paper presents a design method of a kind of testing device,which is used for testing TMS320C6000 DSP integrated chips, And the design and implementation of the system was achieved in two aspects of hardware and software. The author’s main work are outlined as follows:The stage of theoretical description. Describe the theoretical basis of the relevant tests on the chip, give a presentation of the C6000 series DSP integrated chips about the electrical characteristics as well as the hardware configuration, a detailed description of the DSP chip features is also given.The stage of requirements analysis. Based on the analysis of the C6000 series DSP chip hardware structure and internal function modules, given the DSP chips testing system requirements analysis, including electrical parameter testing requirements and internal functional analysis module testing, complete the overall demand for experimental testing device.The stage of System design. On the basis of the requirements analysis, given the overall program designed to the testing system, including the overall structural design of the overall system design and system functions, and finally given the overall system selection and design analysis programs.The stage of Hardware implementation. Firstly, from the electrical characteristic aspect of the integrated chip, given the principles of testing, the specific design scheme selecting, designing, analyzing and the testing method for all the parameters related to Electrical parameters testing.Then, from the functional characteristic aspect of the integrated chip, given the principles of testing, the specific design scheme selecting,designing, analyzing and the testing method for all of the internal resource modules related to Functional modules.Finally, with these two aspects above integrated,designed a complete test system to testing the DSP integrated chips.The stage of System testing. This paper presents the testing results for a certain type of integrated chip by using the system model based on the design scheme of the testing device. A description and analysis of the testing results as well as the comparison with the testing results given by the Multi-meter, to identify the causes of errors and result checking. After the measurement is given a graph plotted based on the measurement result.By adopting this testing device of the integrated chip, which is based on the design scheme above, to verify the multiple sets of testing data of Electrical parameters modules, and the verification, comparison and analysis of testing data of Functional parameters modules, comes to the conclusion that the testing device based on the design scheme above is feasible and effective. Finally, the article gives the design summary of the testing device, and what is to be performed in the next.