Study On The Electrical Stress Source In Low-Light-Level Night Vision Testing Equipment

As the forms of the war became more diversified, the combat modes in all environments have been more and more dependent on the night vision equipment. The testing to the performance indicators of the night vision equipment has become an important research topic.This article designed and implemented an electrical stress source system of a testing equipment for the LLL (Low Light Level) night vision. It is an important part of a LLL night vision testing equipment. It provides electrical stress to meet the power supply requirements of the testing to the LLL night vision.The system can provides4-channel,1-24V low ripple voltage output, and its resolution is25mV. This system includes IPC, a microprocessor, digital-analog conversion circuit, voltage regulator circuit, a signal conditioning and analog to digital conversion circuit. The microprocessor sends the voltage setting value sent by IPC to the D/A converter, the D/A converter converts this digital signal into an analog voltage to control the input reference voltage of the operational amplifier, which is a part of the regulator circuit. Thus the microprocessor achieve adjustable function to output voltage. A/D converter feedback the output voltage that is detected in real time to the microprocessor to achieve closed-loop control. We use the PID algorithm to control the voltage stabilityAfter testing, the system’s function is fully realized, and performance indicators are all satisfied, too. It can provide electrical stress that meet the testing requirements to night vision testing.