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Electric And Light Stress Source Monitering And Control Sysytem In Night Vision Testing Equipment

Posted on:2015-03-16Degree:MasterType:Thesis
Country:ChinaCandidate:L XiaoFull Text:PDF
GTID:2268330425993569Subject:Detection Technology and Automation
Abstract/Summary:PDF Full Text Request
In the reliability testing equipment for Low-Level-Light night vision device, Electricity and light stress source monitoring and control system ensure that the equipment can work under normal specifications, thus ensure the accuracy of test results, so it is very important.In this paper, the main work is to design a light source stability detection circuit, the Low-Level-Light stress source intensity detection circuit, the temperature control circuit, and the PC software which is used to display, alarm and control. Among them, analyzing the principle, noise, wavelength range of the light source stability detection circuit and device selection which consisting of the photoelectric conversion circuit, filter circuit, amplification circuit, emitter follower, using ATmegal6microcontroller as the microprocessor. The Low-Level-Light stress source intensity detection circuit uses APD as photoelectric detection device, and outputs to the single-chip microcomputer for data processing through the transimpedance amplifier circuit, filter circuit and the secondary amplifying circuit. In this paper, a digital PID controller is used to control TEC by SCM software programming method for APD work temperature compensation, to ensure that the temperature tends to a constant and the stability of APD. The PC software based on LabVIEW is used to process, display, storage and query the measured data by communicating with lower machine, as well as controls electricity, light stress sources system.
Keywords/Search Tags:photoelectric detection, APD, SCM, temperature control, LabVIEW
PDF Full Text Request
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