A Universal Test System Design For Radar Based On PXI Bus

With the rapid development of radar technology, radar systems become morediverse and more composite functions. Its development cycle is dramatically shortened.As an important means of radar performance considerations, the radar test system mustbe able to quickly adapt to changing test needs. In this situation, the development of ascalable and versatile basic radar test system is to help reduce system development costsand shorten development cycles, enhance test inheritance, can improve test resultsreliability, provide a more stable and reliable performance justifies the means for radar.This paper discusses the domestic and international test system development process,analysis of the current application prospects and main technical features of the bus,proposed a common type of radar test system design ideas, of the PXI（PCI eXtensionsfor Instrumentation）bus as the core control bus, the CPCI（Compact PeripheralComponent Interconnect）as bus signal bus.With PXI/CPCI hybrid bus as test system centric architecture, and hardwareprogrammable and reconfigurable advantages of FPGA（Field Programmable GateArray）, we may design general-purpose, scalable and reconfigurable radar test system.Through analysising the test system software function requirements, form the basicrequirements of software design, and make designof a variety of software functional.1. Study technical features of several conventional bus as PXI and CPCI todetermine the bus architecture of general-purpose measurement and control system.2. Analyze signal characteristics, then design the bus signal distribution inuniversal measurement and control.3. Design test boards from the the perspective of the enhanced compatibility.4. Complete requirements analysis and specific design for system software.This paper studies the method of building test system using programmablehardware and reconfigurable characteristics of FPGA, solves the problem of high costsand wasting-resources with building-block approach when building test system. Thesemethods can excellently fit sudden increase testing demand, reflect good prospects.