The Function Of Dsp Processor Test

DSP processors have the stability, repeatability, arge-scale integration, programmable and easy to self-adapting processing and other characteristics,So it is very suitable for digital signal processing and related fields, such as the military, wireless communication, speech recognition, graphics/images, instrumentation, industrial control, medical treatment, household appliances etc. Industry insiders even predicted:DSP will be the fastest growing product of the future field of integrated circuit.The market demand has spawned a large number of DSP chip R&D, production, application enterprises. To guarantee the long-term reliable work of the DSP chip, we must carry on the efficient test to it. There are many testing methods of integrated circuits. Choosing a low-cost, high efficiency, high fault coverage testing method is the focus of this paper.After IC design enter the deep submicron stage, circuit complexity and speed continues to increase. The chip testing (including verification testing and manufacturing testing) is facing huge challenge. The traditional use of automatic test equipment (Automatic Test Equipment, ATE) test methods is more and more difficult. In order to improve test quality and reduce cost of test, many design for testability methods came into widespread use, in which the logic built-in self-test(LBIST) method has been proven effective testing method for testing large scale integrated circuit. Although the LBIST without the use of automatic test equipment of ATE, using LB1ST method of testing IC not only need to modify the circuit design, but also add the hardware testing circuit. For complex processor, using LBIST must insert the test point in order to meet the requirements of the fault coverage. These shortcomings not only make the processor design too complex, but also affect the product time to market and the performance of the circuit. Then the emergence of software-based self-test (SBST) gradually attracted people’s attention. It does not require the use of automatic test equipment, and does not need to modify the circuit design, and will not increase the hardware testing circuit as well as will not affect the performance of the circuit.This paper focuses on the study of SBST and talk about the concept and classification of the SBST. The SBST test methods can be divided into three categories. The first category is using random instruction and/or operand SBST test methods. A common feature of this kind of method is almost completely using the random sequence of instructions and/or operand. The second category is structured SBST methods. The feature of this kind of method is using determined sequence of instructions and operands. The third category is hybrid SBST test methods. This kind of method combined to the former two methods form test method. Then give examples that describe the various test methods as well as the SBST test methods comparison with other test methods.Finally, we take ADI company’s ADSP-2181as example. After a brief introduction to the structure and characteristics of the chip, we carry on the function testing on the chip. Each function of the chip was verified as well as fault coverage of the chip was analyzed. After functional simulation, we find the chip’s functionality is correct. Then, using Verifault-XL tool Implement fault simulation for the chip to get the fault coverage. The ALU’s FC is90.4%, MAC’s FC is85.6%, Shifter’s FC is85.3%,DAG’s FC is58.9%.