Test Of DSP Processor Based On Software Self - Test Method

DSP processor has a lot of advantages, including repeatability, programmability, Stability and portability. It is widely used in digital signal processing field, such as picture processing, voice recognition, wireless communication, medical treatment, military affairs, industrial control and so on. One insider have predicted: in the field of integrated circuits, DSP will become the fastest developing product in the future.For these reasons, many related enterprises was founded, which include production, research and application company. As other products, DSP chips need to be able to work long-term stability in different environments, which requires its effective testing. There are many IC test methods, at the same time, there are a lot of common test standards. What this article focuses on is to choose a high fault coverage method, low-cost testing method. After entering the deep sub-micron design stage, the traditional testing methods which use the automatic test equipment(ATE) become more and more difficult. In order to ensure the effectiveness and low cost, a variety of design for testability methods have been widely applied in the test. The method which has been proven effective for LSI is logic built-in self-test method test(LBIST). Although LBIST does not need to rely on ATE, this method is unfit for applied test method, the test will also be required to modify the circuit design of integrated circuits, and in order to improve fault coverage, sometimes need to insert test points, which would increase the hardware test circuit. These drawbacks led directly to the test too complex, or even affect the performance of the circuit. Since the software based self-test method(SBST) appears on, people gradually attracted by this method, compared to other testing methods, it does not need to modify the circuit design and does not require to use ATE. What’s more, it will not affect the performance of the circuit.This article focuses on the DSP function test based on SBST methods, and proposed a test method which is a kind of deterministic SBST test method based on fault model. The method is specific malfunction oriented, and combined with the DSP function test depth. This paper describes the principles and implementation of SBST in detail. It also describes the construct of test platforms, including hardware design and the build of software to framework. In the last part of the article, taking TI’s TMS320F2812 as a case, the paper introduces its internal structure and character and carrying out a detailed functional test to its internal and external resource. Finally, the paper combined with LabVIEW-based PC program has made an analysis of the test results.