Research Of Virtual Digital Integrated Circuits Testing System Based On VIIS-EM Platform

With the rapid development of the semiconductor industry and testing industry,many kinds of new technology and new design of integrated circuits emerged in theworld market. As the time that a large number of new digital chips are putting intothis market, the requirements of its function and performance integrity are also rising.In order to cater to the needs of the digital chip detection, Digital IC Tester came intobeing. It has a irreplaceable position in verification testing, production testing,acceptance testing and usage testing. However, most of the testing markets areoccupied by other countries, the price of purchasing abroad are even more expensive.With the increasingly frequently usage of the digital chips, there is an urgent need fora way to ensure the functionality and performance which is used in a small or mediumscale digital integrated circuit.The design conform to the testing requirements of the university laboratory,which is based on the existing resources–the VIIS-EM system, researched anddeveloped by Jilin University. It has achieved to the digital IC testing technologyintegration. In accordance with the VIIS-EM bus standards and modular instrumentdesign ideas. When designing, it uses “3U” standard size to and “Microcontroller+FPGA” architecture to design. The design adopted the graphical programmingsoftware LabVIEW, which is researched by NI, to control and display at the sametime. LabVIEW adopted the way of data flow to program, and it combined with theextensive image controls and function resources to make it more convenient forinstrument control and debugging. The system development way is based on theneeds of the two testing species. One is the function testing and the other is DCparametric testing. Both testing species are also used to ensure the integrity of animportant theoretical basis of the digital chip functionality and performance. Thedesign adopts the External database to manage chip data. When the instrument isrunning, it can load the experimental information by invoking the name of the corresponding database table, and it can complete the functional and performancetesting automatically. It achieved the fast accurate testing purpose.After designing, it has been tested by several specific experimentations, andfinally given the test results. The experimental results show that the VIIS-EM DigitalIC Tester can achieve a faster, more accurate detection purposes in small ormedium-sized, and what’s more, it can save a large expanse, it has a practical valueand promotional value.