Accelerated Test Temperature Control System

With the development of science and technology, a number of high reliability, long lifeproducts appear. So people need to get the quality of the product information in a short time,which requires the improvement of general life test method,that we can gain life failure samplenumber required by the model in a relatively short test time.The control of the stress levelbecame the key to the accelerated life test, and as a major stress,the temperature through thecontrol which achieves the changes in the level of the accelerated life stress has importantsignificance.In this paper, we combine ARM&Windows CE touch PC and single chip microcomputer,for controling the temperature of temperature box;we put forward the accelerate life teststhe overall design scheme of temperature control system, and introduces the working principleand functions of each part. System adopts DS18B20digital temperature sensor fortemperature box temperature acquisition, temperature were collected will be transmitted to themicrocontroller; Touch PC is used to set the initial temperature which should be sent to themicrocontroller through a serial port;after received the initial temperature,Microcontrollercomparies the initial temperature and temperature measured by temperature sensors,then getsthe control by PID algorithm,and controls the heating circuit power through the amountcontrol; the current temperature will be sent to touch-screen PC at regular intervals bymicrocomputer,we can observe temperature changes in real time through touch PC, if thetemperature is greater than a certain value of the set temperature, the buzzer will beepalarm,and test data can be stored in the form of a text file.On this basis,we complete thedesign of the system hardware circuitand the control program.Finally we maked the steptemperature test for the system, the test show that the system can carry on the temperaturecontrol to the accelerated life tests.