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Defect Measurement Based On The Function Point In Embedded Software Development Process

Posted on:2012-08-23Degree:MasterType:Thesis
Country:ChinaCandidate:B LiFull Text:PDF
GTID:2248330395485442Subject:Software engineering
Abstract/Summary:PDF Full Text Request
With the rapid development of computing technology, network communicationtechnology and software development technology, digitized products that developedfrom embedded software achieved a global breakneck development. Many countries,especially the developed countries, have won great success in this territory byapplying latest technology of the computer and software in traditional equipments.Applying software measurement methods, this paper improves the defectmanagement process of traditional embedded software development process.Analyzing traditional insufficient of software defect measurements, the paperintroduces management process based on the function point. This paper measures thefunction point of embedded software, analyses project development process that isbased on the function point, explains project development process and relatedpersonnel’s work efficiency by the indicator of measurement results and providesessential information for decision-makers. Integrating correcting deficiencies withexploring more useful information for project management, this paper guides project’snormal operation and improves traditional embedded software defect managementmodule. This paper designs and implements a software defect management system,applies this system to the actual project (ventilator) in the development process andanalyzes development process, developers’ and testers’ efficiency by measuring theventilator’s function point and defects.Based on the function point defects measurement’s successfully applying in theactual project-ventilator software development process, it can be concluded that thedefect measure based on the function point for the development of embedded softwarecan provide advanced reference and improve software process.
Keywords/Search Tags:Embedded software development process, Function pointmeasurement, Defect measurement, Defect management
PDF Full Text Request
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