IC Level Electrical Fast Transient Burst Test Repeatability Analysis

Electromagnetic compatibility (EMC) is a new developing discipline, and more and more gets the wide attention of the world. Many countries have made the EMC standard for electrical and electronic products as mandatory standard. Electrical and electronic products electromagnetic compatibility needs the electromagnetic compatibility testing to determine. So the rationality and accuracy of the technology of electromagnetic compatibility testing is critical.Integrated circuit level electromagnetic compatibility problems are subjected to international attention. A lot of EMC labs have been running the EMC testing according to existing EMC standards. But there are still some problems in the EMC testing. For example, there are significant differences between multiple test results in an EMC test. According to this phenomenon, there may be some unreasonable setting in the EMC testing platform, or EMC protection designing of the IC have some defects.This paper makes electromagnetic compatibility test of Integrated circuit(IC) level electrical fast transient burst (EFT) test as the research object and analysis the IC level EFT test repeatability rationally and illustrates the impact factors of repeatability.