Embedded System In SPIFLASH Memory Test Application

The subject of the first test of the concept of semiconductor devices are described, from the type of semiconductor test systems and automatic test system equipment and SPI FLASH memory and test methods were three aspects to start the memory test system, test system analog, mixed-signal test systems, digital signal test system, the internal structure of test equipment, test channel, memory structures and devices of DC testing, AC testing and functional testing and other aspects of the detailed study and discussion. The monopoly of foreign technology in the next test, semiconductor test costs accounted for almost half the cost of the entire chip, in order to satisfy the need for cost control, research and design a low-cost, reliable hardware and software test platform is particularly important to test. Based on existing domestic and international semiconductor test machine has embedded software and hardware technology and technology research, the PMU chip based on modular and fast ADC AD5522AD7685chip module consisting of DC parametric test circuit design. Based on ARM technology and embedded real-time systems design and implementation of the test panel and easy separation of the control hardware and software, the final failure mode analysis based on the FLASH FLASH summarized the failure model, based on model building and discussed the failure of FLASH function test algorithm.