Font Size: a A A

The Dial Indicator Automatically Detect Device Research And Design

Posted on:2012-08-03Degree:MasterType:Thesis
Country:ChinaCandidate:Z G YinFull Text:PDF
GTID:2218330368494005Subject:Electronics and Communications Engineering
Abstract/Summary:PDF Full Text Request
Along with the progress of science and technology, the improvement of managing standard and the technology of detecting tending to the developments of automation, integration and intelligent direction constantly, some traditionally manual testing methods have been changed.Because of the heavy calibration tasks of dial indicator, dial indicator has been widely used in many industries, such as the measuring field. For traditional testing methods, they involve much repetition of labor. In addition of large uncertainty of testing equipment and relatively low efficiency, their testing results heavily rely on the proficiency of operators. However, the design of a set of high-precision automatic detecting dial indicator will show great application value in detecting area, which can be used to improve the testing and managing levels and to reduce labor intensity.The device applied here is produced on the basis of the modern detection technology, electronic technology, computer technology and mechanical technology. This device designs the automatic detecting dial indicators that accords with the standard of "JJG34-1996 indicator verification regulation". In this device, photoelectric sensor is adopted to detect displacement and to acquire displacement data automatically. Except these, mechanical transmission mechanism and a single chip of microcomputer are used to carry out the gathering and controlling on the live-field end, and complete the uploading data. Camera part is applied to collect the dial indicator pointer readings, and computer management software needs to be prepared following the standard, and then form the corresponding report for every test. The practical measurement and analysis prove the testing device achieve the standards.
Keywords/Search Tags:dial indicator, MCU, testing
PDF Full Text Request
Related items