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The Web Services Discovery Based On Agentand Semantic

Posted on:2012-04-30Degree:MasterType:Thesis
Country:ChinaCandidate:Y L WangFull Text:PDF
GTID:2210330362952296Subject:Computer application technology
Abstract/Summary:PDF Full Text Request
Accurately predicting the current technology level of the product and the forward direction of the next generation products has great significance to improve the competitiveness of enterprises. In the long course of the study, theorists made a variety of technology forecasting methods, in which the most effective is the prediction method based on TRIZ theory by the former Soviet Union G.S.Althsuller professor. Altshuller use the number of the patents, the level of the patents, the defect of the patents as patent inspection mode, while he made the technology life cycle into four main stages known as: infancy, growth, maturity.However, among the three indicators mentioned earlier, Altshuller introduce many standards to determine as: a) what kind of knowledge can form the invention; b) whether there is any conflict solved by the invention; c) the invention require repeated attempts. However, to extract the content from the patent, it is quite subjective for the standard a) and c). Second, a variety of online publications, magazine articles and books provide a variety of different interpretation for the five level classification provided by Altshuller, and which are very different from each other, but there is no clear explanation why there is different.Based on the above considerations, we propose a new approach to make the patents of technical and non-technical areas to be five categories. Introduce new standards to distinguish between the levels of patents, which reduce the confusion of the classification of Altshuller's. Avoid the use of very competent standard, such as: degree of innovation, the number of conflicts resolved, repeated attempts.Finally, using the new model grade the American refrigerator patent, and predict its technical maturity.
Keywords/Search Tags:patent level, product technology maturity, TRIZ, patent analysis, patent indicators
PDF Full Text Request
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