Multi-channel High-precision Ic Dc Parameter Testing

IC is currently one of the three major information industry, will inevitably bring about the rapid development of integrated circuits integrated circuit testing device continuously updated, thereby reducing the IC production costs, increase IC production. IC testing is a method to protect the quality of the circuit chip, integrated circuit testing has been attached great importance to many countries, so the research IC test has very important practical significance.For the practical application, we design integrated circuit tester, then introduce multi-channel integrated circuit test board design and research. This design aimed at small and medium-scale integrated circuit testing. First of all, the research paper described the background, from a practical point of view applications designed integrated circuit tester. Further development of the domestic and detailed analysis carried out to explore the domestic and foreign research results of integrated circuit test equipment, integrated circuit tester were three grades of low-grade mid-range high-grade, different grades of the testing instrument test object is not the same. Mainly small and medium-scale domestic integrated circuit tester of the study and design for large-scale ultra-large scale integrated circuit test system of technical standards in developed countries and the gap compared to larger, domestic IC production enterprise LSI The testing is still relying on foreign imports tester for testing, greatly increased production costs, is not conducive to the domestic IC industry, need work out high-speed, low power, cost-effective IC test systems to change the current testing system shortage situation.IC device integration with the rising number of more and more chip pins, test speed requirements are high. The previous one by one pin test can not adapt to the rapid development of integrated circuits, a number of pins, multiple sites simultaneously measure a test system must have the basic functions. This article was designed to impose a number of independent channels simultaneously measured, using a newly developed Quad Parametric Measurement Unit AD5522, with four programmable current ranges, each channel includes FV voltage clamps and FI current clamps, a window compared Used in T-mode measurement. AD5522 can be extended to provide an external high current range.We used AD5522 SPI-serial data transmission, through the 29bits control words control the chip internal registers to complete the survey, to be completed by FVMI, FIMV, TEST and other measurement mode. On the chip through the FPGA logic control, the main design of the SPI serial interface logic, string, and the conversion process and external expansion of range of the relay control logic. The experimental data analysis of several measurements carried out chip calibration and external software calibration, the conclusion that the measured results meet the specification.