Cmos Image Sensor Test Program

CMOS image sensor has been developing rapidly in the past ten years. With advantage of CMOS process compliance, CMOS image sensor is able to integrate both analog and digital circuits to make it a System-On-Chip product. Due to the complexity of its structure, testing is among the most important factor in building such sensor. The paper has studied detailed items in most CMOS sensor testing plan and has categorized these items in to two groups:'operating status tests'and'image quality analysis tests'. Detailed testing items with its definition, test algorithm and pass/fail criteria have been proposed. Three differently scaled testing platforms, a USB 2.0 protocol based scheme, a PXI instrumentation based scheme and a Verigy 93K SoC test system based scheme have been designed to implement test items to form three CMOS image sensor testing solutions.The study has been focused on a systematical analysis on testing need for a CMOS image sensor product rather than a detailed test plan development. Also job is done on testing platform selection criteria. The study aims at a broad analysis of CMOS image testing needs and platform selection thinking so as to provide fresh thoughts on development of such image sensor testing solutions. The paper has the intention to bring ups some reference solution to any domestic CMOS image sensor design company in developing its test solution in both development stage and mass-production stage.