Analog Circuit Cp & Ft Yield Analysis And Yield Promotion Strategy

Semiconductor yield plays an important role in the IC fabrication. The yield level denotes the process ability.High yield can bring great profit to the company.The research will discover the low yield root cause by CP(wafer test) and FT(final test) tests and then take out the corresponding countermeasures.Firstly we reviewd the fundamentals of IC yield and CP&FT tests,then proposed the approaches to define the target of the CP yield,the various failure modes of CP low yield,the root cause of FT low yield and the defect of package shift.And then we performed several practical engineering cases to verify the CP low yield analysis that we mentioned, and finally come out the yield enhancement methods.