A Software For Non-Destructive Evaluation Of Anti-Radiation In Typical Electronic Materials

With the development of the microelectronics technology and aerospace technology, the performance of electronic devices increases greatly. As a serious threat to the reliability of electronic device, radiation rays in space which are reduced by. The degradation of device performance parameters originates from the accumulation of defects in material. Therefore, in order to ensure the reliability of electronic devices operated in the radiation environment, a rapid, sensitive and simple method is needed to evaluate the radiation tolerance of materials. Radiation effect and noise mechanism of SiO₂ dielectric, pn junction and Silicon material have been studied in this paper, and the relationship between the 1/f noise and material defects. As SiO₂ dielectric material for example, The noise non-destructive evaluation method for anti-radiation in it has been established, and using LabVIEW to design and implement an software systems to non-destructive evaluate anti-radiation of electronic materials. In this paper, the major work done following:1. Radiation effect and noise mechanism of SiO₂ dielectric, pn junction and Silicon material have been studied in this paper. The relationship between the 1/f noise and material defects as well as noise sensitive characterization method of radiation damage in SiO₂ dielectric material have been analyzed. The noise nondestructive evaluation model of SiO₂ dielectric material has been established, and the parameter extraction method is given, and the non-destructive evaluation program is designed.2. Based on these results, the use of LabVIEW platform to complete a software system for nondestructive evaluation anti-radiation in typical electronic materials. According to the noise test frequency range, select the appropriate data acquisition board and complete the evaluation system of collecting module.The continuous acquisition and storage technologies have been researched, and a long-time continuous acquisition and data storage has been achieved with the queue structure in LabVIEW.3. Based on the evaluation program, the burst-noise analysis module, and the evaluation-model-based module have been designed an implement, it using for assess and forecast anti-radiation of SiO₂ dielectric, pn junction and Silicon material.