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Research And Application Of The High Voltage Control System Of Diffractometer Based On The ARM And The UCOS-Ⅱ

Posted on:2010-05-17Degree:MasterType:Thesis
Country:ChinaCandidate:P AnFull Text:PDF
GTID:2178360272982319Subject:Circuits and Systems
Abstract/Summary:PDF Full Text Request
X-ray diffractometer is now widely used in many fields such as metallurgy, petroleum, chemical, scientific research, aerospace, teaching, materials production. X-ray tube is one of the key components of X-ray diffractometer. When X-rays were excited, it will produce two different spectrums, continuous spectrum and characteristic spectrum. Whether the X-ray characteristic spectrum and continuous spectrum can meet the experimental requirements is decided by the X-ray tube working state. So that is why we need to have precise control of the state of X-ray tube.This paper proposed a scheme of diffraction instrument high voltage control system based on ARM and uCOS-II, According to X-ray tube working status and the requirements of job-related functions of diffractometer. And after analysis and research, we realize and validate the scheme. In this paper ARM works as the main control chip and completes the X-ray tube working status control and other related control functions with the CPLD chip. Because of many required mission, we brought in the embedded operating system uCOS-II based on ARM. In this paper, we completed the corresponding schematic and printed circuit board design. We transplant embedded operating system of the uCOS-II based on LPC2378. We realized the precise control of the X-ray tubes status as well as optical gates, water control and other related functions based on uCOS-II. We also completed a CPLD design of the auxiliary function.The system has been the actual installed and debugging. Test results showed that the system can meet the design requirements and the full functionality of the scheme was achieved. And precise control of the state of X-ray tubes and other related functions were fulfilled.
Keywords/Search Tags:ARM, uCOS-II, CPLD, X-ray diffractometer
PDF Full Text Request
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