Memory Neighborhood Pattern Sensitive Fault Testing Algorithm Improvement

With the rapid semiconductor technology development, the density of the Random access memories (RAM) has been higher and higher. The testing technology of RAM needs more and more feasible failure mode and effective testing algorithms. The Neighborhood Pattern Sensitive Faults (NPSF) have been considered as complex faults that require long test time. Based on the further study of Neighborhood Pattern Sensitive faults, we proposed one optimized test algorithm. Using Tiling method, it performs NPSF detection following regular sequence to change test patterns. This algorithm could detect all 3 Type-I NPSF: Static NPSF, Passive NPSF and Active NPSF. Its test length, which is shorter than previous traditional test algorithms', is 65.2 times of the memory density. Testing results consolidate it is one high efficient test method for Neighborhood Pattern Sensitive Faults.