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The Design And Simulation Of The Interior Ballistic Memory Testing System

Posted on:2009-01-25Degree:MasterType:Thesis
Country:ChinaCandidate:X R YuFull Text:PDF
GTID:2178360245978909Subject:Armament Launch Theory and Technology
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In order to adapt the investigation of the modern weapon system, memory testing technology has rapidly been developed. By the way of modern testing method, the interior ballistic memory testing system has extensive foreground. This system is laid in the gun-barrel for its small volume. It may collect the data on the special condition of high temperature, high pressure, large impact and so on in the gun-barrel, which may collect and store the interior ballistic data. Relative to interior ballistic testing instrumentality of traditional manual testing and external instrumental testing etc, the interior ballistic memory testing system takes on assured predominance.This thesis includes several points as follows:a) The thesis designs the main scheme. After finishing analysis of the tested signal, the general systemic scheme is designed.b) The thesis mainly designs systemic hardware based on the general systemic scheme. This circuit uses high performable microprocessor ADuC841 as kernel. The simulated signal which is outputed from sensor is disposed and transformed into digital signal by disposal signal circuit and A/D switch. Then the digital signal is stored in the memorizer. Connecting this system to computer through communication interface, the testing data could be read.c) The software is designed which includes the program about the part of singlechip and the part of communication interface.d) The thesis debugs and simulates the part of disposal signal circuit. According to the result of simulation, parameters are rectified for optimizing circuit. The result of simulation may prove the circuit is correct.e) In order to insure systemic security, the systemic configuration is designed after finishing design of the hardware and software. At last, the intensity of configuration is analysed.
Keywords/Search Tags:memory testing technology, interior ballistic, ADuC841, A/D switch
PDF Full Text Request
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