Study Of Good Yield And Efficiency In TFT-LCD Module Process

TFT-LCD display is a new photoelectric industrial with advanced technology. In short time it will replace CRT display thoroughly. Now it is facing two problems of low yield and low efficiency during mass production. In the thesis it focuses on improving bonding conditions and line balance to achieve the goals and with lower cost to enhance the competitive power in the market.In this thesis, it introduces present status of TFT-LCD mass production. We set up a plan that optimazes bonding conditions and get better line balance during manufacturing process to get higher yield and better efficiency.In JI process there are two defect phenomena of bonding particle and bonding defect. The reason of bonding particle is the bad cleaning result in bonding area. We will introduce a new way with cleaning cloth wiping off solide particle and Plasma cleaning the liquid organic. We select higher performance-price ratio cleaning cloth and optimize cleaning time to saving the running cost and achieve the cleaning result. Bonding defects have different factors and action. Solution of bonding lightly is increasing pressure and modifying transmission accuracy. About conductive particle broken solution is taking Plasma cleaning to wipe off micro particle. About insufficient quantity of conductive particle in bonding area, the solution is re-designing a new kind of ACF with higher density of conductive particle and new structure to solv this issue. In the course of studying quality controlling tools are taken into pratice such as DOE and fishbone diagram to save time and cost. Generally the defect ratio descent from 0.34% to 0.14%.In MA process the job of operator is assying and inspection. The key factor of line output is the workload unbalance. To raise the capacity we make workload balance to break the bottle neck of the line. To increase the inspection speed, we share the good experience of oprators and standardized the operation. Thus function inspection time descent by 35% and visual inspection time descent by 18.5%. According to the defect ratio change the order of test pattern and defect will be detected eralier which can save 100 seconds per piece. Optimizing the inspection pattern which make the variation of workload descent from 10.75 seconds to 2.75 seconds and basically achieving line balance. The capacity is raised with IE tools with which be put into action to the line balance improvement. The tools provide a standard way to solve problem duing process which be wildly used in manufacturing.Resource management is helpful during mass production. The operator with training could be fit the position 2 months eralier and improv the yield. With ERP manufacturing management becomes more efficiency.During mass producrion there are quite a few factors.The solution in this thesis can be benefit in cost down of manufacturing process and will advance the ability of developing and manufacturing.