Study Of Embedded Memory DFT Algorithm Based On BIST

With the maturity of VLSI technology, the integration of chip keeps increasing in accordance with Moore's LAW. Chip testing issue has become a bottleneck restricting the development of the whole industry. Nowadays, the proportion of embedded memory in chip design is more and more. So embedded memories diagnostic and tests become more and more important. Considering from the fault types, test equipments and testing costs, BIST technology is a very effective method in the testing technologies of embedded memory.First of all, the thesis researches the testing design theory of system chips. Then, the thesis gives a deeper discussion of BIST in design-for-test and illuminates the research situation of this area. Besides, the thesis explains the related theories and methods of embedded memory BIST including the fault model of memory and the test algorithms of embedded memory, particularly analyzes the March algorithm. Then, the thesis puts forward an improved March algorithm——March-TBA based on the existent algorithm. The algorithm not only covers more distinguishable fault kinds in the testing process and intensifies the fault-diagnosed capability, but also shortens the testing time. Finally, the algorithm was simulated by using the simulation software——ModelSim. The comparison and analysis were carried out between the experimental data and the existence data. And the result shows that the improved algorithm can cover most faults. Accordingly, it testifies the validity of the algorithm.