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Research And Development On Test Technology Of LED Photoelectricity Parameter

Posted on:2007-05-20Degree:MasterType:Thesis
Country:ChinaCandidate:W G LinFull Text:PDF
GTID:2178360212966476Subject:Mechanical Manufacturing and Automation
Abstract/Summary:PDF Full Text Request
Recently LED industry develops very quickly in our country, and has obtained the breakthroughs continuously in LED technique; therefore its applications are more and more widespread. In present stage, the chip seal is the main method adopted in the production of LED industry in our country. LED test technology and method are not advanced relatively, and cannot meet the request of LED industry development in our country. The test levels in some enterprises are very low, the functions of the test instruments with low test precisions are not good, and therefore the performances of their products cannot be compared mutually. In the same time, many enterprises rely on the imported test instruments, which are very expensive generally. In a word, the overseas LED measuring instrument has the high performance and the high accuracy characteristic, the domestic LED instrumentation is defective in technology, the examination precision and the speed all cannot satisfy the enterprise demand.This kind of condition is extremely disadvantageous to the development of LED industry in our country. Therefore, it is very important for promoting LED industry in our country to develop independently the fast test technology of LED photo-electricity parameters, and the intellectualized online separation equipments.The comprehensive parameters of LED optics, colorimetry and electricity are the main technical specifications. In this thesis, the author mainly studies the test technology of LED photo-electricity parameters to promote the scientific standardization of LED test technology.According to the domestic and international requests of the test technology for the fragmental LED, the author has combined with the virtual instrument technique and the collecting data principle, and developed the fast test system of LED photo-electricity parameters. The...
Keywords/Search Tags:LED spectrum, Photo-electricity transformation, Test technology, PCI DAQ, Virtual Instruments
PDF Full Text Request
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