RF IC Automatic Test Technology Based On Virtual Instrument

The modern integrated circuit technology developed very quickly. Replacement of electronic products becomes faster. Test of electronic products face enormous challenges. The high cost of test is becoming a bottleneck in the development of IC industry. In this paper, I researched the RF chip automation test technology based on virtual instrument. The introduction of virtual instrument technology breaks the shackles of tradition desktop test equipment. Modular hardware is used to build the test system. Users only need to write different test procedures to achieve different test content. We developed a system to test TI CC2530ZigBee wireless communication chips and modules to verify our theory. We also developed a system to test our own wireless sensor network chip.The first chapter of this thesis describes the research background, gives a brief introduction to integrated circuits, radio frequency communication and virtual instrument technology. Test is a very important part of IC industry. But China’s IC test technology was underdeveloped. So we must do some research to improve the situation. The second chapter describes the RF communication system architecture and test parameters and gives an introduction of the Internet of Things. ZigBee is a key technology of the Internet of Things. In this article, we study test technology of ZigBee chip/modular. In this chapter, I give a detailed description about the physical layer of ZigBee. The third chapter describes the test system design. The first section describes the overall design of the system, including system connectivity and parametric test methods. The second section selects the test equipment for the test system according to the system design described in the first section. Contrast to traditional bench-top and modular hardware test equipment, we choose modular hardware as the system test hardware platform. According to the testing requirements of the system, we design a test application circuit for the device under test. The third section describes the system software architecture. The fourth section executes the test process. Chapter four summarizes the work of this article and gives an outlook of future work.