Test Technology Research Of The LC82380 Circuit

Design Technique, Manufacturing technique and Test Technique are regarded as three key techniques of IC (Integrated Circuit). With the development of techniques, especially the emergence of LSI, VLSI and SOC, the function of IC are becoming stronger, the complexity of structure, the difficulty of testing and the test proportion of cost are increasing.Except for compiling test programs and extracting test vector, it is more important that the test technique may testify the design, diagnose the faults﹠orientation and analyze the windage of workmanship. Then the manufacturing period can be shortened.The paper elaborates the test method of LC82380. TheLC82380 high performance 32-bit DMA controller with integrated system support peripherals circuit employed CMOS workmanship with 1.2micron silicic grid. The area of chip is approximate 7.4mm×7.2mm. the PGA132 package-ceramic pin grid array is employed. The input time clock is 50MHz. It is mainly composed of DMA controller (82C37), interrupt controller (82C59),programmable interval timers(82C54), DRAM refresh control, wait state generator and system reset logic.As for the many footprints and complex functions of LC82380, we put forward the module analysis method to functions test. For each module, we program and analyze independently. It is better to analyze faults and orientation and simplify functions.DC is one of the key parameters in reflecting the quality of CMOS circuit and workmanship level. The paper elaborates several test methods of DC parameter and test destination of LC82380 required. Meanwhile, we put forward several skills, which can shorten test time in test DC parameter.AC parameter requires that digital circuit can output correct response in regulated time with fixed input. The paper introduces several methods of testing...