Font Size: a A A

LabVIEW Applying In Electronic System

Posted on:2007-01-04Degree:MasterType:Thesis
Country:ChinaCandidate:Y WangFull Text:PDF
GTID:2178360182977836Subject:Computer application technology
Abstract/Summary:PDF Full Text Request
Dielectric loss of virtual capacitive-type equipment is an important index of performance of reflect insulation performance of the electric power capacitor, the electric capacity tube and current mutual induction of the electric capacity in electric network. By measuring dielectric loss angle can monitor defect of insulation of insulation virtual capacitive-type. The aim is amplifying design scheme and running scheme of on-line measurement system for dielectric loss of virtual capacitive-type equipment, analyzing error reason, effect on error of system and revising methods.This paper presents the principle and instrument structure of on-line measurement system for dielectric loss of virtual capacitive-type equipment. This instrument measures tan S by collecting the synchronized high-speed data of reside voltage and leakage current of electronic equipment. Because of the affection of temperature noise of the signal passages and electromagnetism interference, collect a great deal of noise of the two signals. By using correlation method collects tan δ, if the noise spectrum of the two signals are not overlapped, then based on irrelevance principle of different frequency signals, the noise of signals haven't effect on the test, otherwise lead to measurement error. Therefore in order to assure the accuracy of measurement results, adopting wavelet transform to eliminate noises from the collected signals, then using correlation analysis method to obtain tan δ of these signals.The system is based on wavelet , GPRS network and SPC correlation technique, which can efficiently solve the problem of eliminating noise from signals, removing the electromagnetism jam to measure the result of influence, global area and full auto on-line measurement, to attain the higher precision of measurement. By applying the construction of virtual instrument, LabVIEW, has the characteristics of the superiority of performance of test and high degree intelligence.
Keywords/Search Tags:Dielectric Loss, Virtual instrument, Wavelet analysis, SPC
PDF Full Text Request
Related items