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Research On Intelligent Fault Diagnosis System Based On Syncretic Policy

Posted on:2005-03-28Degree:MasterType:Thesis
Country:ChinaCandidate:Q K LiFull Text:PDF
GTID:2168360152955521Subject:Control theory and control engineering
Abstract/Summary:PDF Full Text Request
With the fast development of IC, the design of electric circuit have developed from SSI circuit design based on logic gate to MSI, LSI, VLSI design, It's a pity that a additional problem occur: the harms of instruments faults have increased, We can't fast find the material diagnosis of instruments, thus, Fault diagnosis has become more and more important in social produce. The technology of fault diagnosis have appeared in America since 60's, more and more researchers of projects have put it on an import role all over the world.This article describe an intelligent fault diagnosis system based on syncretic policy, in the paper, the basic knowledge on intelligent fault diagnosis have been briefly described. In addition, some correlative technologies-BST, BIT and virtual instrument technology are presented, these have been ready for design of this intelligent fault diagnosis system.This intelligent fault diagnosis system are composed of software and hardware, the hardware is realized by single chip machine and currently CPLD, this system find the material fault of fault board by sending measured signals to fault board, then collecting and analyzing responsible signals by syncretic using some policies. In addition, in this paper, the material selection of hardware scheme is described in detail, the flow charts of software are listed also. In practice, it proved that this system could fast and exactly find most faults of system and saved plenty of manpower and material resources.The last, some suggestions are presented for the researches in the future.
Keywords/Search Tags:Intelligent Fault diagnosis, Visual instrument, BIT, BST, Single Chip Machine, CPLD/FPGA, VHDL.
PDF Full Text Request
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