Research On Pulsed Laser Induced Single Event Effects

Pulsed laser Technique has been proved as an effective tool to provide both spatial and temporal information of single event effects (SEEs) in the internal device and circuit. It is essential to evaluate and mitigate the SEEs in microelectronic circuitry for space science and engineering.In this thesis, the experimental research on SEEs is performed on the Chinese first pulsed laser SEE experimental device based on independent technology. An overview of SEE research and the pulse laser simulation background are provided. The present mechanism is developed by adding comprehensive correction coefficients in the calculation of equivalent LET which affect the effective quantitative expression. And a novel universal quantitative evaluation method is proposed in terms of Volume Energy Transfer (VET). Based on the series of test device evolution, the experimental method including devices preproccess, threshold measurement,sensitive regional orientation and cross section test are completed. The basic pulse laser SEE test process is summarized on the study the single event transient (SET) test. Experiment with different structure or function analysis of typical devices and circuits are investigated, especially, for photoelectric devices, analog circuits and power supply sub-systems. The circuit simulations in the thesis focus on the analog circuit SET effects, and the preliminary device simulation verified framework and methods are performed. The designed circuit mitigation method is verified by fault injection with pulsed laser. In accordance with the pulse laser test results of the transient pulses, a novel technique for exploing the SEEs on board is proposed. Finally, we give the full summary and the related experimental research prospect.The specific innovation points as follows:During the research of pulsed laser quantitative expression process, the correction coefficients of equivalent LET were well designed by the consideration of both subject devices and pulsed laser. And the novel VET expression could make a more accurate quantitative evaluation on SEEs. We launched the first international pulse laser SEEs test of photoelectric devices and the radiation circuit hardening, and the results were similar with the heavy ions data. The regional three-dimensional localization method and the test tenique of both LET threshold and cross section were firstly established, which made an effective realization of the quantitative estimation sensitive volume. The international pulse laser SEEs test of anolog circuits and the relevant units of power supply sub-systems were tested, and the devices and circuits output raw test data showed the characteristics of the inter different sensitive devices. A novel detector based on the optocoupler for exploing the SEEs on board was proposed with active monitoring space flight testing, the circuit was much more casual and smaller which can detect certain dynamic single event effects scope.