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Research On Identification And Life Assessment Technology For Integrated Circuits

Posted on:2022-12-02Degree:MasterType:Thesis
Country:ChinaCandidate:S ChenFull Text:PDF
GTID:2518306764972809Subject:Telecom Technology
Abstract/Summary:PDF Full Text Request
With the rapid development of the integrated circuit industry,the phenomenon of counterfeit integrated circuits in the gray area has become more and more intense,which has caused huge economic losses to the integrated circuit industry on the one hand,and on the other hand,buried serious hidden dangers in the application field of integrated circuits for safety and reliability.Physical unclonable functions due to their low cost,low overhead,unpredictable and other excellent characteristics,in the field of recognizable technology can provide a lightweight high-security authentication platform for chip identification;on-chip detection sensor with its effective characterization characteristics of circuit aging,in the field of life assessment technology can more efficiently detect the recovery or refurbished chips,the above two embedded detection technologies can actively prevent counterfeit integrated circuits at the source,and have a wide range of application prospects in the field of hardware security.In order to meet the detection needs of counterfeit integrated circuits,it is necessary to identify non-genuine chips and recycled refurbished chips with embedded detection circuits.In view of this situation,this thesis proposes an embedded detection circuit design scheme including the variable-frequency ? variable-stage ring oscillator PUF and the lightweight life sensor.In this thesis,by analyzing the developability and actual design requirements of PUF,this thesis designs the structure of the variable-frequency ? variable-stage ring oscillator,the stage specifications can be flexibly switched,and based on the response information feedback configuration method,the design scheme of the PUF system is proposed to improve its random performance.Through the demand analysis of life assessment,this thesis adopts a life assessment method based on aging detection and measurement,also designs and establishes the life model of lightweight life sensor based on NBTI effect.Finally,under the 0.13?m CMOS process,the embedded detection circuit is fully customized method to design the layout,through the analysis of variable-frequency ?variable-stage ring oscillator PUF's FPGA implementation results and life sensor's simulation test results,it shows that the PUF circuit reaches 48.29% of PUF's uniqueness and takes reliability into good account,it also has strong random performance and antiattack ability,and the lightweight life sensor has reached detection success rate of 100%for the tested chip aged for 180/365 days.The embedded detection circuit research in this thesis has important application significance for preventing the proliferation of counterfeit integrated circuits.
Keywords/Search Tags:Counterfeit Integrated Circuit, Physically Unclonable Functions, On-chip Detection, Ring Oscillator, NBTI effect
PDF Full Text Request
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