Microwave Vector Field Imaging Based On Diamond NV Center

Recently,quantum precision measurement technology has been widely used in the field of measurement.It has the characteristics of high resolution,high sensitivity,non-destructive and quantum calibration,and can achieve accurate imaging analysis.Nowadays,the internal structure of integrated circuits is becoming more and more complex,so it is particularly important to accurately analyze the integrity of integrated circuits.Therefore,quantum precision measurement technology has attracted extensive attention in the field of chip testing.Nitrogen Vacancy(NV)center is a light-emitting point defect structure in diamond.It has excellent optical properties and spin polarization properties.It can be used as a temperature sensor for biological cells,and can also be used for precise measurement of microwave magnetic field.Aiming at the high-resolution measurement and imaging analysis of the surface of various microwave devices,this paper proposes a vector field measurement and imaging system method based on the diamond NV center orientation.This method can be used for microwave antennas and monolithic integrated microwave circuits(MMIC)and other microwave devices provide accurate measurement results,and can provide good solutions in application scenarios such as antenna near field testing,chip failure analysis and good product screening.The main research contents of the paper are as follows:1.Developed an optical fiber near field probe based on micron-level diamond NV center.The taper fiber coupling laser has the characteristics of high efficiency and good fluorescence collection effect for conduction,and the diamond NV center is fixed at the tip of the tapered fiber to realize the preparation and mass production of the probe.2.A fiber-based diamond NV center probe imaging system is proposed.The pulse modulation method is used to effectively control the synchronization of the laser pulse and the microwave pulse,which greatly improves the efficiency and accuracy of the system measurement,and realizes the split ring resonance(SRR)antenna near field test.Field testing and imaging results are consistent with the high frequency structure simulator(HFSS)simulation,which verifies the correctness of the method theory and the feasibility of practice.3.A chip near field test system based on the orientation of the diamond NV axis has been developed.The original system has been improved to solve the problem that the NV axis of micron diamond particles could not be oriented in space,and realized a more accurate characterization of the surface of the MMIC low noise amplifier chip.The imaging results clearly show the circuit distribution and signal strength of the chip,and the system is used to explore the method of high-frequency signal measurement.