Research Of Flexible Automatic Test System For Typical Analog/Mixed Signal Chip

With the rapid development of China's integrated circuit and semiconductor related industries,the complete testing of the performance and function of semiconductor integrated circuit is the guarantee for the successful mass production of various chips.Among them,analog/mixed signal chip is an important part of the integrated circuit industry.It is necessary to accurately and quickly detect the typical analog/mixed signal chip to evaluate its product design excellence and the severity of failure defects,and provide accurate basis and direction for improving or supplementing the corresponding functions of the chip.Therefore,it is urgent to develop a high-precision and efficient flexible testing system for analog/mixed signal chips,which is of great significance to the production and test of semiconductor integrated circuits.This paper analyzed the general national standard testing method and structure on the analog/mixed signal chips.On the basis of it,combined with the principle of the flexible testing technology,the hardware and program design are carried out,and a flexible automatic test system for typical analog/mixed signal chips is proposed.A flexible automatic test system for typical analog mixed signal chip is studied and designed.The contents of this paper focus on the research and system design of typical specifications and critical parameters,the realization of multi station parallel testing,user-defined parameters and simplified interface design,the encapsulation and expansion of functions in the testing program,the modification of internal reference voltage,the optimization of trimming algorithm and the evaluation of process control ability of the system.Finally,the design of the flexible automatic test system is verified by experiments,which can be applied to the mass production testing of three kinds of typical analog/mixed signal chips.Firstly,this paper studies and analyzes the testing methods and principles of three kinds of analog/mixed signal chips based on national standards,analyzes its design principles according to the internal key circuit structure of its technical indicators,and formulates the corresponding monitoring model and test scheme according to its design parameters.Secondly,according to the test parameters and hardware resource configuration of the corresponding typical chips,the testing programs are developed and the tick parameters are simplified for customization.And the algorithm improvement and optimization of the Bandgap Voltage Trimming architecture based on embedded EPROM.Therefore,an automatic round-robin search method based on the reference model is proposed,which greatly reduces the testing time and improves the testing efficiency.Finally,combined with SPC technology,the process capability of the mass production test data of the flexible test system is analyzed.The results explain that the process capability indexC _p?C_pk and performance capability indexP_pk are more than 1.03,which meet the production acceptance standard.In addition,the testing data shows that the error of the key parameters is about 0.3%.The experimental results illustrate that the automatic test system can quickly and efficiently achieve the mass production test of typical analog/mixed signal chips,and the results have strong practical value and engineering significance.