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Freeform Metrology Using 2D Contact Profilometry and Specialized Fixturin

Posted on:2019-01-18Degree:M.SType:Thesis
University:The University of ArizonaCandidate:Scordato, MichaelFull Text:PDF
GTID:2478390017988518Subject:Optics
Abstract/Summary:
Advancements in the design and fabrication of optics are pushing the limits of metrology. Freeform surfaces are becoming more common through the provision of non-symmetric corrections to a system's wavefront. This may result in improved performance with less optical elements in a system's design. Fabrication tools have been developed, yet the measurement techniques and drawing specifications of these surfaces are not well defined.;There are several approaches to characterize a freeform lens. Profilometry is a common method to measure the profile of an optical surface by using a calibrated stylus. 2D profilometer instruments are popular due to their affordability and versatility. An investment is required to increase a contact profilometer's capability for 3D aspheric surfaces. This paper will focus on expanding a 2D contact profilometer's capability by using a specialized fixture with references to map multiple tracings in software. In addition, the fixture will also characterize the centration of the optic.;This paper compares the results found with various metrology instruments. The specialized fixture was measured with a 2D contact profilometer to provide full surface characterization of the freeform optic. An advanced 3D profilometer was used to provide measurements for evaluation. Included will be a discussion comparing the freeform data gathered from the different instruments to expected performance using a spherical lens.
Keywords/Search Tags:Freeform, 2D contact, Using, Metrology, Specialized
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