| As the feature size of IC chips approaches deep submicron sizes, many current-based IC test metrics suffer from leakage currents and parametric variations. The development for an appropriate test method to compensate for these issues becomes important and urgent.; The defect class such as partial resistive bridges and opens comprises a significant percentage of the defects causing speed and delay failures. Energy consumption ratio (ECR) testing has been effective at detecting classical stuck-at faults. This thesis extends the previous work on the ECR to the new defect models. The detection of these new defect models with the ECR method is studied. The change in supply voltage brings on different power consumption from good and faulty circuits. The underlying reason as to why the ECR test method is good at detecting the delay defects is presented. Like many current-based test metrics, the ECR is also affected by leakage currents. The generalized ECR test is formulated with the consideration of leakage current. It provides good fault coverage under the new environment.; The success of any test method depends on good controllability and observability. Modern test methods demand less area overhead and fast test application time. Many test application techniques available in the market today offer a compromise between these parameters. This thesis proposes a new technique, called Broadcast BIST (B2IST), which produces less area overhead and fast test application time. B2IST uses time division multiplexing to set multiple storage elements in a group on a single data line in a scan clock. For instance, it can be an appropriate test application technique to the ECR test method. B2IST is applicable to the boundary scan. The combination is referred to as Broadcast boundary scan (B2S). B2S is synchronous at the operating system clock. It bridges slow testers and fast IC chips. The feasibility of the B2S scheme is verified through theoretical and experimental studies. |
