Methods for Extending High-Performance Automated Test Equipment (ATE) using Multi-Gigahertz FPGA Technologies

This thesis presents methods for developing multi-function, multi-GHz, FPGA-based test modules designed to enhance the performance capabilities of automated test equipment (ATE). In recent years technological advancements in semiconductor technology have outpaced advances in ATE testing capabilities, thereby causing significant challenges for new high-speed device testing. The main motivation of this research was to develop solutions that address these challenges.;The methods shown in this thesis are used to develop a design approach that utilizes a test module structure in two blocks. A core logic block is designed using a multi-GHz FPGA that provides control functions. Another block called the "application specific" logic block includes components required for specific test functions. Six test functions are demonstrated in this research: high-speed signal multiplexing, loopback testing, jitter injection, amplitude adjustment, timing adjustment. Furthermore, the test module is designed to be compatible with existing ATE infrastructure, thus retaining full ATE capabilities for standard tests. Experimental results produced by this research provide evidence that the methods are sufficiently capable of enhancing the multi-GHz testing capabilities of ATE and are extendable into future ATE development. The modular approach employed by the methods in this thesis allow for flexibility and future upgradability to even higher frequencies.;The methods allow a next-generation FPGA to be quickly integrated into a test module to increase performance. Similarly, new components can be designed into the "application specific" block for additional test functionality. Therefore the contributions made in this thesis have the potential to be used into the foreseeable future for enhancements to semiconductor test capabilities.