Research On Semiconductor Device Characteristic Test System Based On New Source Measurement Unit

Semiconductor device is one of the core devices in the electronic system design industry.The birth and development of semiconductor devices has greatly improved human life and promoted the development of human society,when using semiconductor devices to design electronic systems,you need to understand their various operating characteristics,Semiconductor device characteristic test system is an important instrument for testing the characteristics of semiconductor devices and the source measurement unit(SMU)is an important part of the semiconductor device characteristic test system.This article first analyzes the testing principles and deficiencies of traditional semiconductor device test systems,proposes a semiconductor characteristic test system architecture based on source measurement units,introduces traditional analog closedloop SMU circuits,and analyzes their functional principles,the theory of active shunt circuit is introduced,and the working principle of active shunt SMU circuit is introduced based on active shunt theory.The simulation of the feasibility of the function of two SMU circuits is verified on the TINA-TI simulation platform,according to the theory of signal and system transmission stability,the stability of the negative feedback closed loop of the SMU circuit was tested and analyzed,and the design process of the SMU hardware circuit based on the Cadence Allegro platform was also introduced,this article also introduces the implementation scheme of the SMU circuit under the digital domain closed-loop control which is different from the analog closed-loop and also introduces its theoretical feasibility and gives the implementation scheme.This article introduces the debugging process of the SMU hardware circuit,including the debugging process of each discrete circuit function and the writing of the driver program.A Lab VIEW host computer is manufactured to work with the hardware SMU circuit to form a semiconductor characteristic test system based on a new source measurement unit.In addition,the test of the 1N4739 forward I-V characteristic curve of the diode and the output characteristic curve of the transistor S8050 are introduced.The test curve is analyzed,and the system test results are accurate,the test and source output functions of the semiconductor characteristic test system based on the new source measurement unit are realized.The experimental results show that the new source measurement unit can meet the accurate test of the characteristics of semiconductor devices.The circuit scheme studied in this topic has practical production and scientific research guidance value.