32-channel Large Area Array Infrared Detector Test System Technology Research

Infrared detection technology is widely used in military,agriculture,industry,transportation,aerospace,medical and other fields.As the core device of infrared detection technology,infrared detector and its application technology are the hot spot and core that every country strive to develop first.Enlarging the scale of imaging array and reducing the pixel size of infrared detector is the main development direction of infrared detector.The verification and test of infrared detector is an important link to check the performance and quality of infrared detector,and also an important basis and support for the improvement of the back-end process of infrared detector.Multi channel large scale infrared detector plays an important role in astronomical observation,photometric measurement,earth observation and other fields.At present,China is in the important stage of the research and development of large scale infrared detector.The development of a test system for multi-channel large scale infrared detector is of great significance for the research and development of large scale infrared detector and the technical upgrading of the current large scale infrared detector,which can realize the functions of detector drive,voltage and current monitoring,data acquisition,real-time imaging,conventional parameter calculation,etc.Based on this background,this paper demonstrates and studies the related technologies of 32 channel large scale infrared detector test system,designs and builds a set of infrared detector test system which can support 32 channel,4K × 4K array infrared detector testing.The hardware of the test system is based on the platform design.PCI / PCIe + PXI / PXIe bus device is used to realize the driver and data acquisition functions of the detector.A set of transfer circuit with high applicability is designed to complete the signal transfer between the test equipment and the detector.In addition,in order to solve the problem of low acquisition accuracy and large noise when ad module collects large range analog signals in the test system,the voltage separation and reduction technology is used and the detector output preprocessing circuit is designed in this test system,finally,the adaptive acquisition of high-precision and low noise is realized with the acquisition module.In the aspect of software function,through calling hardware API function,the management and calling of hardware equipment are realized,and the operation of detector driving,data reading,image reorganization,display imaging,conventional parameter calculation,image non-uniform correction(NUC),etc.are completed.In view of the large amount of data read out and the high difficulty of real-time imaging of 32 channel large area array infrared detector,CUDA Programming technology is specially studied in this project,which makes full use of the advantages of CPU and GPU in logic control and calculation ability,completes the infrared image processing and real-time imaging work together,and ensures the high refresh rate of large area array infrared imaging picture.After the successful construction of the test system,the background noise of the system is less than 150 ?V,which meets the design requirements of the system noise.A 4-channel medium wave 320 × 256 element array infrared detector with known performance is used to test and evaluate the built test system.Finally,it is confirmed that the imaging effect of the test system is good and the test results are accurate.Two analog voltage signals are used to simulate the analog output of 32 channel large area array(array size 4096 × 4096),and the acquisition,display imaging and calculation are carried out.It is proved that the test system has the ability to test the 32 channel large area array infrared detector.Finally,the subject also carried out system improvement and optimization of the test system: In order to solve the problem of output difference between analog channels in the preprocessing circuit,k-b correction is done at the software level to ensure the consistency of each channel of the test system and improve the test accuracy of the system;According to the needs of the system,the self-test function of the system is integrated in the software to complete the inspection and management of hardware equipment and improve the stability of the system...