Investigation On Lifetime Assessment Of Analog IC Based On Accelerated Degradation Testing

The long lifetime indicator of complete machine system is the premise and basis to assure national security.To adapt to international circumstance and the requirement of its application,complete machine system must have characteristics such as long-term storage,availability at any time,which means high reliability.As analog integrated circuits are one of the core components in complete machine system,its long storage lifetime and long working lifetime has become a very important indicator.Since the failure data of highly reliable and long lifetime analog integrated circuits obtained under normal experimental conditions is very limited,it is very difficult to perform traditional failure data based reliability analysis.Performance degradation based reliability analysis has become a new direction and has become an effective method to assess the reliability and lifetime of analog integrated circuits.For highly reliable and long lifetime analog integrated circuits that degrade slowly,increasing certain stress level can accelerate the process of its performance degradation.Compared to traditional lifetime experiments,parameter degradation based lifetime assessment can provide more precise lifetime assessment and has better reliability and reasonableness.In this thesis,taking highly reliable analog integrated as the study object,we researched optimize designing technique of degradation acceleration experiment scheme that suits the characteristics of analog integrated circuits,the implementation methods of degradation acceleration reliability experiments under combined stress and long lifetime assessment techniques,in order to implement the long lifetime assessment of analog integrated circuits under specified conditions.The main contents are:1.The research of degradation sensitive parameter and failure criteria of analog integrated circuits.2.The research of optimize designing technique of degradation acceleration in analog integrated circuits.By deep analysis of degradation acceleration experimental theories and methods that suits the characteristics of analog integrated circuits,we achieved precise and efficient assessment of long lifetime of highly reliable analog integrated circuits that is based on optimized designing technique of degradation acceleration experiments.3.The verification research of long lifetime assessment technique for analog integrated circuits.For the three typical highly reliable analog integrated circuits represented by operational amplifier SF-XXX,driver SW-XXX and digital analog converter SDA-XXX,we implemented accelerated storage under combined stress,working degradation experiments and normal storage,and degradation experiment under working stress.The lifetime data extrapolated from accelerated storage and working degradation experiments,is compared with data extrapolated from normal storage and working degradation experiments,to verify the consistency of device sensitive parameter degradation trajectory function and lifetime distribution function,and the correctness of accelerated degradation model obtained from accelerated conditions.