Research On Testing Technologies Of Analog Integrated Circuits

Analog IC has been widely applied to various fields of life as a discipline in the field of electronic technology, and the development of the analog IC is also increasing its impact on our daily lives. As a class of analog integrated circuits technology, the test system plays a crucial role in the reliability and effectiveness of the circuit. Compared to digital integrated circuits, analog integrated circuit has a various of structure and atopic. due to this result, it is difficult to form a standard test systems standardized, but which also makes analog integrated test systems research appear more meaningful.Firstly, when the test system inputs the information which collect by the data acquisition module to the computer, the computer will process the information by software which named Lab VIEW and Matlab. Then according to the fault dictionary method and wavelet transform method the computer will analyze the fault feature to achieve the purpose of fault diagnosis and localization.In this test system, it involves not only the choice of test node but also the extraction algorithms of fault feature and the form of the platforms. Considering the characteristics and purpose of this test system, the system uses a single test node to extract the fault information, and then uses the software to complete the design of the multi-channel filter in order to accomplish the fault diagnosis.Finally, the test system uses the fault characteristic values which obtained by software emulation and specific experiments to make a detailed analysis. Finally, although the design of the test system can basically meet the testing needs, but certainly there are some notable improvements, we will continue to improve it in the following time.